SEM Scanning Electron Microscopy

My position: Material Testing > SEM Scanning Electron Microscopy

Instrument model

Zeiss Sigma 300；Zeiss Gemini 300；Zeiss Merlin Compact；Hitachi S4800；JSM-7800F；Zeiss Supra 55

Service model

Commissioned test

Service cycle

7.8 working days

Service items

Morphology observation (non-magnetic sample)

S$xxx

Morphology observation (magnetic sample)

S$xxx

EDS point scanning

S$xxx

EDS line scanning

S$xxx

EDS mapping

S$xxx

Gold sputtering (each batch)

S$xxx

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Testing Description

Sample requirement

Examples

Q&A

Documents

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Testing Description

Scanning Electron Microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. It is suitable for characterization of surface morphology of Liquid/Powder/Film/Bulk samples. Through the EDS point scan, EDS Line scan and EDS Mapping, the information about the chemical composition of a sample, including what elements are present as well as their distribution and concentration on the sample surface can be revealed.

Sample requirements

1.Powder samples: dry condition, with minimum weight of 5-10 mg.

2. Bulk samples: dimension should be less than 5mmx5mmx1mm. For cross-section observation, you can opt to scissors cutting or liquid nitrogen bending methods.

3. Liquid samples: Use a pipette to take the suspension of the sample after ultrasonication, drop a drop on the silicon wafer or tin foil, and dry it with natural air/infrared light. After drying, stick the silicon wafer or tin foil on the sample table with conductive adhesive.

4. Samples consist of Fe, Co, Ni are considered with magnetic properties. It may not be able to obtain clear images for such samples at high magnification.

Examples

1. SEM morphology observation

2. SEM-EDS scanning and mapping

A) Point scan

B) Line scan

C) Mapping

FAQs

1. Why spray gold for non-conductive or poorly conductive samples?

SEM imaging is to obtain the signals of secondary electrons and backscattered electrons through the detector. If the sample is non-conductive or poorly conductive, the accumulation of excess electrons or free particles on the surface of the sample will not be able to be conducted away in time, and after a certain degree, the phenomenon of charging and discharging will occur repeatedly, which will eventually affect the transmission of electronic signals and cause image distortion. Deformation, shaking and other phenomena, the surface conductivity of the sample is enhanced after gold spraying, so as to avoid the phenomenon of accumulation.

2. Will gold sputtering affect the morphology for non conductive samples?

After the surface of the sample is sprayed with gold, only a few to a dozen atomic layers of gold are covered on the surface, and the thickness is only a few nanometers to a dozen nanometers, which has almost no effect on the appearance.

3. What is the difference between SEM energy spectrum spot scan, line scan and mapping?

The energy spectrum point scan, line scan and mapping are to obtain the semi-quantitative information of the elements of the sample in the point range, line range, and surface range, respectively. In addition, line scan and mapping can also analyze the distribution of elements in the line or surface range. . Their significance is that point scanning can test the type and content of elements at a certain position of the material. The significance of mapping is mainly to understand the regional distribution of material elements, and the significance of line scanning is to understand the element content of each point on a line of the material. Variety.

4. What is the difference in sampling depth between SEM-EDS and XPS testing?

The XPS sampling depth is 2-10nm, and the EDS sampling depth is about 1um.

Resources

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